| Design-for-Test (DFT) & ATPG Engineer at Remote, Remote, USA |
| Email: [email protected] |
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Processing description: http://bit.ly/4ey8w48 https://jobs.nvoids.com/job_details.jsp?id=2299364&uid= From: shrasti singh, vyzeinc [email protected] Reply to: [email protected] Job Description - Design-for-Test (DFT) & ATPG Engineer Skype , Remote Need LinkedIn Job Overview: We are looking for a DFT and ATPG specialist to contribute to the development and validation of digital test methodologies. The ideal candidate will have experience in scan chain design, fault modeling, and test pattern generation, with a strong understanding of industry-standard DFT architectures and techniques. Key Responsibilities: Develop and implement design-for-test strategies including JTAG (1149.1, 1149.6, 1687), IEEE 1500, scan chains, and logic BIST. Work with JTAG/1500/1687 test infrastructures, including writing and interpreting BSDL, ICL, and PDL files. Optimize test compression, on-chip clocking, and apply various logic fault models (e.g., stuck-at, transition, bridging, cell-aware, timing-aware fault models). Perform scan insertion, automatic test pattern generation (ATPG), coverage analysis, and pattern validation to ensure high fault detection. Utilize Cadence Modus/Genus or Mentor Tessent/MBIST Architect for test implementation and validation. Develop automation scripts using TCL, Python, or Perl to enhance test and verification workflows. Collaborate on post-silicon validation, including pattern conversion for ATE, silicon bring up, debug, and characterization. Work closely with backend design teams on aspects like timing analysis, clock domain crossing (CDC), and chip integration. Apply memory BIST (MBIST) techniques, including test algorithms and IO loopback strategies. Preferred Skills & Experience: Expertise in digital test methodologies and DFT feature implementation Keywords: card Design-for-Test (DFT) & ATPG Engineer [email protected] http://bit.ly/4ey8w48 https://jobs.nvoids.com/job_details.jsp?id=2299364&uid= |
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| 05:48 AM 29-Mar-25 |